Jenoptik Measuring Systems Enable Precise Roughness
PMTS 2019: Jenoptik’s metrology systems start with four available probe systems, two of which are capable of measuring both roughness and contour measurements.
The Jenoptik W800 and W900 devices feature the evaluation software, Evovis, which enables automatic configuration when changing the probe system or probe arm.
The metrology devices are available as either a compact desktop version or a complete measurement workstation.
Jenoptik’s metrology systems start with four available probe systems, two of which are capable of measuring both roughness and contour measurements. A quick change adapter enables the operator to retool the system easily. Available probe arms also come standard with magnetic couplings, simplifying probe arm replacement across the platform.
Speed has also been increased, with the W800 system capable of 20 mm per second positioning. The W900 is capable of 200 mm per second positioning speed, with a positioning repetition of less than 10 microns, enabling users to reduce inspection cycle times and increase output, according to the company. The devices also feature the evaluation software, Evovis, which enables automatic configuration when changing the probe system or probe arm. The devices are available as either a compact desktop version or a complete measurement workstation.
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