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Zeiss Software Increases 3D Measurement Data Compatibility

Zeiss has launched Zeiss Inspect, a system-independent data evaluation for optical and CT measurement data.

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Zeiss Inspect CAD. Photo Credit: Zeiss Industrial Quality Solutions

With the release of its novel Zeiss Inspect 3D metrology software, Zeiss Industrial Quality Solutions offers customers numerous new functions. Zeiss Inspect Optical 3D is a solution for the inspection and evaluation of any 3D measurement data (e.g., optical 3D data, volume data, image moving data). With this release, data acquisition is accelerated, and evaluation functions are further improved. The new Autosurfacing app also automatically converts scan data into a high-precision CAD model.

Zeiss Inspect combines various technologies and applications to help customers master daily metrological challenges. In addition to optical inspection, the software enables computed tomography (CT)-based quality inspection. The Zeiss Inspect X-Ray, for example, simplifies defect analysis — a new Multiview function makes it possible to display and analyze multiple workspaces with different perspectives of the component in parallel. Also new is the feature Region of Interest to analyze individual parts of a component with different tolerances. 

Zeiss Inspect forms the core of the Zeiss Quality Suite. The platform offers software products and complementary services. Direct access to training, updates, news and apps simplifies daily work in metrology. With this year’s release, customers can purchase license subscriptions in the Zeiss Quality Software Store in an automated self-service, initially offered in Germany only. Metrologists also have the option of further customizing their software — many apps for solving specific measurement tasks are available in the store, some of them free of charge.

The Zeiss Quality Suite enables a seamless, cross-product workflow, combining Zeiss Inspect with Zeiss PiWeb for comprehensive statistics and reporting options. It acs as as a holistic, digital control center for metrology.

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